Kelvin Probe Force Microscopy Implementation Guide

This technical note outlines the implementation of the attocube attoAFM I microscope with a Kelvin probe force microscopy (KPFM) upgrade, detailing the necessary hardware and software configurations for two acquisition modes: amplitude modulation (AM-KPFM) and frequency modulation (FM-KPFM). It presents a comparative analysis of these modes using a bilayer moiré structure of graphene and hBN, demonstrating that FM-KPFM achieves superior lateral resolution compared to AM-KPFM. The document explains the principles of KPFM, including the measurement of contact potential difference (CPD) through electrostatic forces and the operational mechanics of both AM-KPFM and FM-KPFM. It describes the setup requirements for each mode, including the electronic configurations and feedback mechanisms necessary for effective operation. The note serves as a guide for users to navigate the trade-offs between sensitivity and resolution when selecting the optimal KPFM mode for nanoscale surface-potential mapping.