Spatially Resolved Layer Thickness Analysis of Coatings

This case study explores the use of micro-XRF spectrometry for analyzing the layer thickness and composition of copper-aluminum coatings on glass substrates. It details measurement conditions, results from high-resolution mapping, and quick multi-point measurements, demonstrating the effectiveness of the M4 TORNADO system in achieving accurate and efficient analysis of thin metallic layers. The findings highlight the balance between measurement time and spatial resolution in quality assessment.