Dynamic Part Average Testing Implementation Case Study

This case study examines the implementation of Dynamic Part Average Testing (PAT) limits by a high-volume automotive microcontroller manufacturer to enhance equipment efficiencies while maintaining the quality of the device testing process. The document outlines the challenges faced due to the ongoing chip shortage in 2021, which necessitated an increase in production capacity without compromising quality. The traditional method of using Static PAT limits was replaced with Dynamic PAT limits, allowing for real-time adjustments based on device measurements. This shift led to a reduction of over 2% in false rejects and unnecessary scrap, as well as improved overall equipment efficiency. The PathWave Manufacturing Analytics solution facilitated the monitoring of production line data, enabling timely updates to the Dynamic PAT limits. The results indicate that this approach not only reduced retesting but also ensured a higher volume of quality components could be delivered to customers more swiftly.