AI-Powered Guided Analytics for Yield Analysis

This document is a technical report that outlines the capabilities of Exensio® Guided Analytics (GA), an AI-driven analytics layer designed to automate the mining of manufacturing and test data. The report details how GA enables the analysis of 100% of aligned data daily, significantly improving the efficiency of yield analysis. It highlights the challenges faced by teams that manually evaluate only a small percentage of data, which delays root cause identification. The GA platform prioritizes yield limiters, diagnoses root causes through automated AI/ML analysis, and provides structured analysis flows for users. Additionally, it describes the automated yield dashboard that links yield excursions to relevant data sources, thus reducing the time needed for root cause analysis from weeks to hours. The report also presents various use cases demonstrating the effectiveness of GA in identifying yield degradation and improving test cell efficiency, showcasing the platform's ability to surface critical insights quickly and efficiently.