High-Speed Access and Test IP Solution Overview

This document is a success story detailing the collaboration between Synopsys and Amazon Web Services (AWS) to develop a High-Speed Access and Test (HSAT) IP solution. The objective of this solution is to utilize existing high-speed functional interfaces, such as PCIe and USB, for testing and monitoring semiconductor devices throughout their lifecycle. The document outlines the challenges faced in advanced node technologies, particularly the need for low defective-parts-per-million (DPPM) metrics and the limitations posed by traditional test pin speeds. It describes how the HSAT IP solution leverages the native functional protocols of high-speed interfaces to enhance test bandwidth and reduce the number of required GPIO pins. Additionally, the document presents the benefits of this approach, including the ability to conduct in-system tests and diagnostics without needing additional test pins. The conclusion emphasizes the advantages of increased bandwidth and reduced test costs, enabling efficient testing across the entire silicon lifecycle.