WavePulser 1X Short/Open and 2X Thru De-embedding Application Note

This application note details the use of the WavePulser 40iX to estimate gating parameters for de-embedding S-parameters measured on structures terminated in a short or open. It explains the methodology for applying a 1X Short/Open fixture to derive gating parameters, which can be used to de-embed the fixture's influence on the measurements. The note outlines how the gating parameters are calculated from single or multi-port configurations and discusses the assumptions made regarding fixture properties. Additionally, it introduces the concept of 2X Thru with Gating de-embedding, which combines the 1X Short/Open approach with fixture splitting techniques. The document also describes the process for fine-tuning gating parameters and the implications of using differential traces in the measurement setup. The application note is structured to provide a comprehensive understanding of the de-embedding process and the necessary steps for accurate measurement results.